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CMOS Image
Sensor Test Solution
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| New, high-parallel test solution
incorporates highspeed interface technology to enable
evaluation and production test of advanced CMOS image
sensors. | |
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Flexible support for multifunction image
sensors
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| CMOS image sensors are now
incorporating functions such as AD/DA and other SoC circuits.
T2000 modular architecture enables testing of these complex
devices by configuring the tester with optimal instrument
configurations to meet the test requirements at the lowest
cost of test. |
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1.2Gbps high-speed image
capture
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| The module's high-speed
image-capture interface supports a variety of CMOS image
sensors including mobile, DSC, DSLR, CAM, and industrial CIS.
In addition, the large dual bank capture memory enables
simultaneous data storage and data transfer to the image
processing engine, minimizing test times significantly. |
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Differential
input:
Serial data: 1.2Gbps, 4 lanes x 4
channel
Parallel data: 200M pixels/s, 16 bits x 4
channel |
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Large capture memory: 128M pixels x 2
banks
Capable of storing continuous image data of up to 255
frames |
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Parallel testing up to 64
devices
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The module's ultra high-volume
simultaneous measurement capability enables uniquely high
productivity and a significant cost savings for image sensor
testing. And, most importantly, the system's optimized, and
uniform light source and large user area enables 64-parallel
testing of ultra-high-density and quality, as well as
high-performance devices.。
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440mm probe card and
2048ch Frog Unit (pogo interface)
User area: 252 x 208mm
Large exposure
area: 160 x 150mm | |
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T2000 module configuration for CMOS
image sensor testing
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| 800MDM
(800/500Mbps) |
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128 I/O pins per module |
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SCAN Test Function |
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Memory Test Function |
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High Voltage Digital
Pin |
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Source Synchronous
Tests |
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Multi Time
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| 1.2GICAP
(1.2Gbps) |
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Serial Input |
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Data Rate: 1.2Gbps
Data: 4
port x 4ch, Clock: 1 port x 4ch |
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Parallel Input |
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Data Rate: 200M pixel/s
Data:
16bit x 4ch,
Clock: 1bit x 4ch
Trigger:
1bit x 4ch |
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Capture Memory |
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Memory Capacity: 128M
pixel/bank
Memory Bank: 2
bank/ch | | |
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| PMU32 for
ADC/DAC |
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32 DC pins per module |
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High Speed DC Linearity
Test |
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Wide Coverage of
Voltage |
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Range (±0.7V to ±40V) |
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200mA Maximum
Output | | |
| DPS500mA |
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32 DC per module |
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500mA Maximum
Output | | | |
| LSMX+EXMFIS |
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Test Head Slots : 46 slots
| MF Size: |
800(W) x 1050(D) x
1600(H)mm
+1100(W) x 1050(D) x
1600(H)mm | |
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