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Digital Consumer Solution
High-performance, low-cost SoC test solution optimized for high-volume manufacturing of today's complex consumer devices
 
Drastic reductions in cost-of-test

Offering increased parallelism and high-speed digital and analog modules, the T2000 test system provides dramatic reductions in cost-of-test which is critical for digital consumer market with:

A new compact ATE footprint (LSMF)
A new digital module (800MDM) which offers high density (128 channels) and low cost
Two new analog modules (AAWGD, BBWGD) with 2x the channel counts of alternative solutions
A new DC test solution (PMU32), which provides 32 high accuracy channels per module, for ADC/DAC and other DC test challenges
* Based on ADVANTEST COST model
Combining these and other features enables twice the throughput and half the cost-of-test.
 
State-of-the-art, feature-rich capabilities
 
The T2000 test system responds to the needs of the digital consumer market's ever-increasing demand for product versatility and sophisticated functionality with:
 
Multi Time Domain functionality for testing multiple frequency domains simultaneously
Analog modules (AAWGD, BBWGD) providing full-spec test, providing coverage from high-performance audio to video and baseband
PMU32 module capable handling a broad spectrum of precision test including ADC/DAC linearity
6.5GDM for supporting test of HDMI, SATA, and other high-speed interfaces
800MDM which provides measurement functionality necessary to validate source-synchronous interfaces, such as for DDR2
Combined with newly developed test modules and LSMF, T2000 provides optimized test solution for fast growing consumer devices.
 

Analog modules provide broad coverage
Digital Consumer Solution

Various modules for your digital consumer device testing:

6.5GDM
6.5Gbps
Differential 8I + 8O per Module
Header Hunt Function for Non-deterministic Latency
Clock Data Recovery for Embedded Clock Interfaces
Clock Tracking Mode for Source Synchronous Interfaces
800MDM
128 I/O pins per Module
SCAN Test Function
Memory Test Function
High Voltage Digital Pin
  Source Synchronous Tests
Multi Time Domain
800Mbps License
  200/400/800Mbps
500Mbps License
  125/250/500Mbps

 
AAWGD for Audio
Audio AWG
8 AWG ch per Module
(4 L/R pair)
24bit/200Ksps
Audio DGT
8 DGT ch per Module
(4 L/R pair)
18bit/820Ksps (20bit/51Ksps)
BBWGD for BaseBand, Video
BaseBand AWG
8 AWG ch per Module
(4 I/Q pair)
16bit/400Msps
BaseBand DGT
8 DGT ch per Module
(4 I/Q pair)
16bit/128Msps
Hardware DSP Engine
PMU32 for ADC/DAC
32 DC pins per Module
High Speed DC Linearity Test
Wide Coverage of Voltage Range (±0.7V to ±40V)
Device Power Supply

LCDPS
8ch per Module
4A Maximum Output
DPS500mA
32ch per Module
500mA Maximum Output

LSMF
Test Head Slots: 26 slots
MF Size: 800(W) x 1050(D) x 1600(H)mm
Maximum Site Controller Count: 4
T2000
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