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Advantest
Introduces New T5771ES Flash Memory Test
System
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Advantest's
Low-Cost Desktop Flash Memory Tester Reduces
Time-to-Market by Bringing Testing to the R&D
Lab
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T5771ES Flash Memory
Test System
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TOKYO, Japan,
November 30, 2001 -- Advantest Corporation (TSE: 6857,
NYSE: ATE) has announced that it has begun offering its
new T5771ES Flash Memory Test System that will allow
design engineers to perform testing while still at their
desks. Designed for use within R&D labs, the T5771ES
is a scaled down version of Advantest's T5771 Front-end
Flash Memory Test System (June 2001 release) that gives
users access to the latter system's testing performance,
but in a quieter, more economical, energy-efficient
unit. The T5771ES will be on display at Semicon Japan
2001, to be held from December 5th to the 7th at the
Makuhari Messe convention center in Chiba prefecture,
Japan.
Thanks to their expanding storage
capacities and increasing miniaturization, flash
memories are being incorporated into a growing and
increasingly diverse generation of new consumer
electronics such as mobile handsets, digital cameras,
and MP3 players. With all these new end-use
applications, it seems inevitable that the size of the
flash memory market will eventually rival that of the
DRAM market. The short product life spans of these
applications, however, have made it imperative that chip
manufacturers reduce the turnaround times for their chip
development so that they can quickly ramp up to volume
production of a variety of different flash memories, and
meet their extremely tight market windows. In addition,
flash manufacturers are also demanding for new ways to
decrease manufacturing costs and thus protect their
profit margins.
The T5771ES helps to solve these
problems by providing design engineers with a compact
solution that gets rid of the need to schedule time on a
manufacturing-line test system in order to evaluate
devices under development. Users of the T5771ES will be
able to perform initial evaluation of their devices,
develop test programs for manufacturing-line testing,
and use the results from failure analysis of their
devices to debug their designs--all without having to
leave their desk.
The T5771ES thus helps
accelerate time-to-market by reducing the amount of time
spent in the design stage, while also eliminating the
need to invest in "big-iron" full-function test systems
for the evaluation of new designs.
To ensure
that it can be easily used within R&D labs,
Advantest has designed the T5771ES so that it can also
run on a 100V outlet. And, compared to the T5771, it has
1/8th the footprint and consumes only 1/20th the amount
of electricity. These improvements, however, have not
come at the expense of testing performance. As well as
the T5771's basic spec for a functional testing speed of
100 MHz and an overall timing accuracy of +/-0.5 ns, the
T5771ES also possesses the T5771's high-speed Flash
Match circuitry, simultaneous testing capability, and
ability to test or mask defective blocks on a
block-to-block basis.
The T5771ES also shares the
T5771's FutureSuite software (July 2001 release), which
allows users to write test programs for simultaneous
testing in the same fashion they would write test
programs for the testing of a single device. And because
FutureSuite employs a graphical user interface (GUI),
users are able to manipulate files and start up
applications by merely clicking their mouse on icons
located on the unit's screen. In addition, the T5771ES
gives users the option to program in either the industry
standard C or ATL (Advanced Test Language)--the
company's proprietary test programming language. The
T5771ES can also be easily connected with installed
computer networks, which helps improve the efficiency of
device evaluation, failure analysis, and the feeding
back of information to the production
line.
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