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Unique in its
class, Advantest's new M4841 Dynamic Test Handler
enables high-throughput parallel test for very high
volumes of devices and supports complex ICs and
packages, including BGA, CSP and QFP. Because of its
advanced performance capabilities and features, the
M4841 is the optimal dynamic test handler for high
volume production of devices used in consumer products
such as portable digital equipment and automotive
systems.
Reduced Cost of Test
The M4841 is capable of parallel test
of up to 16 devices, double the capability of the
earlier, industry-leading handler, also from Advantest.
The M4841 also delivers a high throughput of 18,500
devices per hour. With three times the throughput
capacity of its predecessor, the M4841 sets a new
standard for the industry. Because of its high test
efficiency, the M4841 is well-suited for high-volume
production lines. With its unprecedented combination of
16-device parallel test and 18,500 device-per-hour
throughput at 3 seconds test time or less, the M4841
makes a substantial contribution to reduced cost of
test.
Supports Test Across Wide
Temperature Range
The M4841 maintains a constant
temperature and devices can be cooled to -40
or heated to 125.
This wide temperature range ensures that the M4841 can
be used to simulate device application environments with
severe temperature ranges, such as those experienced in
automotive or avionics. By minimizing the effects of
heating or cooling upon throughput, the M4841 offers
consistently high speeds and performance, even at
temperature extremes.
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