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Fast handling means high throughput
The M6241 features a compact design for its handler
mechanisms and insert mechanism. Its efficient design
allows this high-throughput test handler to retain the
footprint of its predecessor systems (T5588/M6300) while
doubling parallelism up to 512 DUTs. The M6241's high
throughput is made possible by dramatically reduced
device transport times within the handler. |
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Improved temperature accuracy and
utilization
Equipped with a new mechanism for controlling test
temperatures, the M6241 reaches its target temperature
at speeds 50% faster than those of its predecessor. In
addition, its temperature range for stable operation is
up to 17% greater. These enhancements contribute to
greater test throughput, as well as higher yields.
Flexible pitch support reduces cost
of test
Parallel Attachment of the M6241 takes the form of a
kit, making device interface pitch changes easy. In
contrast to previous products, where pitch changes
necessitated entire new designs based on the handler
mechanicals, this use of a kit mechanism allows
flexibility to adapt to pitch changes. This increased
degree of freedom of device-interface design contributes
to reduced total cost of test by allowing the main body
of the handler to be used without modification and
reduces delivery times for new device interfacing. | |
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| Major Specifications |
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Target Packages: |
BGA, CSP, TSOP1, TSOP2 |
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Simultaneous Testing: |
Up to 512 devices |
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Throughput: |
20,000 devices per hour |
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Temperature Range: |
-40°C to +125°C
-55°C to +125°C (optional) | |
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