As cell phones and notebook PCs become more compact and yet incorporate ever more enhanced functionality, memory devices have correspondingly increased in speed and in storage capacity.
Furthermore, the demand for stacked devices, such as DRAM + flash devices and multi-chip packages (MCPs), has skyrocketed due to the diversification of the end-market usage.

The M6300 offers a high-speed and flexible testing environment for these complex and variable devices, by incorporating a range of innovations including high-speed handling technology and a newly-developed contact mechanism.

High Throughput Cuts Testing Costs

The M6300 greatly reduces costs due to its high-speed handling of up to 12,000 devices/hour (approx. 1.9 times faster than conventional models).
When combined with T5588/5587, this handler affords greater reductions in testing costs, offering the industry’s most cost efficient, high-throughput total testing solution.

Stable Operation Ensured by Precision Contact

A newly developed contact force control mechanism utilizes air-pressure control to effectively minimize failures by enabling the system to delicately adjust both contact pressure and speed, when handling smaller, thinner and lighter devices such as CSPs.