|
|
 |
|
|
|
|
Supports from
DRAM Test for 300mm Wafer Probe to Package Test for
Flash Memories
| |
|
|
|
|
| The T5375 achieves high speed
simultaneous testing of up to 256 devices per system for
wafer probe applications. For back-end processing, it
supports at-speed test (up to 286MHz DDR mode) for
tomorrow's Burst and Synchronous Flash memories.
Moreover, for high volume production in a handler test
cell, it simultaneously tests up to 128 devices in
parallel (double the capacity of the previous
model). | |
|
 |
DRAM & Flash functions are
compatible with previous T5300 family.
|
|
The Memory Repair Analyzer
(MRA4ev1) has been upgraded both in performance as well as
algorithm flexibility.
|
|
|
|
|
|
|
| |
T5375 |
| Target
Devices: |
DRAM,
SDRAM, DDR devices,
SRAM, flash memories,
Direct
RDRAM, EPROM,
Mask ROM, etc. |
| Test
Speed: |
143/286MHz
(DDR mode) |
| Simultaneous Testing: |
Up to 256
devices
(for 128 devices x2stn;
x8/x9bit) | |
|
|
|
