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T5592
Memory Test System
Super High Speed Memory Test System Capable of 1.066GHz Data Rate
The T5592 achieves a super-high test data rate of 1.066GHz (DDR mode) to support RDRAM, SSRAM, and developing DDR-SDRAM applications. In response to accuracy requirements of these highest bandwidth devices, the T5592 incorporated a highly linear timing reference and Per Pin timing generators into a liquid cooled, stabilized test system. While achieving superb accuracy the T5592 also delivers 64 device parallel test for high volume productivity.
Direct RDRAM is a trademark of Rambus Inc.


533MHz/1.066GHz (DDR mode) high speed testing.


High throughput for 64 device simultaneous production test.


High reliability and stabilization through our unique liquid cooling system.


Compatibility to T5300/T5500 family testers to reduce turn around time (TAT).
  T5592
Target Devices: RDRAM, DDR-SDRAM, high-speed SRAM, etc.
Test Speed: 533MHz/1.066GHz (DDR mode)
Simultaneous Testing: Up to 64 devices
IC Test System
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