As digital still cameras become increasingly commonplace, CCD image sensor devices are attaining new heights of resolution and performance. To keep pace with these continuing advances in CCD devices, Advantest has introduced its new T8571A image sensor test system, which not only delivers enhanced test performance capabilities, but retains a high level of compatibility with its predecessor (T8571).

The T8571A is also equipped with analog capture, as well as a high-speed CCD driver, providing support for speeds of 80 MHz. With these robust capabilities, this tester can meet the high-speed imaging test requirements arising as CCD devices continue to evolve.

Dedicated image-processing engine and large image-capture memory improve throughput
The T8571A employs an architecture which allows an increase to the number of parallel-tested DUTs while maintaining full test effectiveness. The combination of a high-resolution image sensor and parallel test for up to eight devices makes possible a dramatic improvement to throughput.

GUI environment reduces evaluation/analysis times
The T8571A system software not only facilitates mastery of the programming language, but is also constructed around a user-friendly GUI environment. These features help achieve major decreases in time otherwise consumed by test program creation and debugging, as well as device evaluation and analysis.

As an option, the T8571A also offers test program developers a tester simulator, allowing them to develop (i.e., editing, debugging, parameter change, and offline test) programs in an offline environment. This option offers the possibility of reducing test system use time.