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falling computer and consumer
electronics prices are leading to increased pricing
pressures on manufacturers of memory devices. This in
turn is creating a very competitive environment. To
combat this trend, DRAM manufacturers have long been
pressing for a test solution that cuts the cost of test
for high-volume DRAM production, and ADVANTEST's new
M6242 dynamic test handler paves the way for wide cost
reductions in device testing by offering a higher
throughput of 42,200 devices per hour.
Industry's highest throughput of
42,200UPH
The M6242 supports memory device package types such as
BGA and CSP, and its throughput of 42,200 units per hour
is more than double that of the company's previous
model, M6241. It offers highly efficient device
transfer, thanks to optimization of the complex arm
mechanisms that sort good and bad devices after testing.
The M6242 enhances productivity and slashes overall cost
of test.
Improved temperature control
mechanisms
The M6242 enables more precise temperature control,
following optimization of mechanisms in the temperature
stabilization chamber. Temperature stability
improvements mean that precision of the new M6242
surpasses that of its predecessor by 25%, with an
accuracy of ±1.5°C when set at -10°C to 100°C, resulting
in higher overall yields.
Greatly enhanced operability
Designed for ease of operation, the M6242's large screen
displays a more detailed menu than the previous model.
Vital information, including test time and temperature
along with visualized switches is provided at-a-glance.
This makes the system easier for the operator to run and
contributes to shorter operation times. |
