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M7522
Dynamic Test Handler
Highly accurate contact placement offering fine-pitch support for driver ICs

The adoption of FPDs (flat panel displays) for use in PC monitors and large screen TVs is on the rise, and they are rapidly becoming mainstream components for these applications. FPDs rely upon driver ICs for their functionality, and as the demand for higher-definition continues to grow, the devices are naturally trending towards ever higher pin-counts. ADVANTEST's new M7522 Dynamic Test Handler is designed to


 

accommodate these new devices, allowing multiple numbers of driver ICs to be tested in parallel and delivering higher throughput.

Support for the future tape trends
When considering the components of a driver IC, the cost ratio of the tape, which serves as the base, accounts for a relatively high percentage. The M7522 is able to set the TAB and COF tape feeding direction more precisely than our conventional model, which was one per perforation. Now, because contact areas are greatly reduced and owing to a greater positioning accuracy, the M7522 affords a reduction in the amount of tape required. And, because of its highly precise contacts, the M7522 handler has the ability to support new tape trends.

Better-production hours
The trend toward higher pin-count devices is creating challenges for operators, because precision contact is all the more important and maintaining accurate needle alignment is critical. In addition, conventional structures demand that operation be performed at elevated positions depending on the size of the tester. Aided by its fully automated capabilities, easy-to-work-with design and faster mechanical operation, the M7522 handler provides greater on-line production time. Furthermore, because the unit examines the condition of the needle tip prior to cleaning and positioning, preemptive maintenance is performed and errors averted.

Rich array of data calculation functions and modes of operation
The M7522 can provide information useful for production management such as mapping of a tape required for the status analysis, category information, and pass ratio. The M7522 contributes to continuous operation by providing various operation modes useful for effective production including the swap test for checking the status of contacts while automatically moving over DUTs, the retry mode, and the forward-feed operation.

Major Specifications
Target Tapes: TAB and COF
35 mm/48 mm/70 mm
Wide, Super-Wide Types, etc.
Reel Diameter: Up to 620 mm
Device Length: Up to 28-perforation pitch
(4-device parallel test of 7-perforation pitch devices available by option)
IC Test System
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