From refrigerators and washing-machines, to cellular phones, gaming, HDTV and cars, consumer products now incorporate an unprecedented amount of advanced technologies.
Embedded flash-memory-based MCUs are dominating new system designs, true even in high-volume production because of flash memory's improved performance, flexibility and ability to be reprogrammed.
Improved performance, life, and reliability have all been pivotal to the success of flash MCUs.

For applications including computer peripherals, home appliances, and automotive uses, embedded flash is replacing ROM and one-time-programming (OTP) solutions by meeting the long-term stability and cost goals set by these well established technologies.
Manufactures of flash MCUs need low-cost, high-speed test solutions to meet faster speeds and the rapid generational turnover of these devices.
Advantest's new T5782 offers the industry a flexible and cost-efficient answer to these needs.

Best-in-class test speeds and enhanced functionality for low-cost production testing
The T5782 is designed with per-site architecture and industry-leading speeds of 266MHz/533Mbps, Advantest's T5782 Memory Test System is ideally suited for testing today's flash memories, as well as future device generations including memory-embedded microcontrollers and rapidly evolving memory bus environments.
The T5782's at-speed, at-specification performance meets the requirements of tomorrow's Known Good Die (KGD) and MCP memory solutions.

Comprehensive Memory Test Functionality
The system boasts an ability to simultaneously test up to 256 devices and shares advanced technologies and performance features in a footprint half the size of its predecessor, the T5781.
The T5782 also incorporates many flash functions including ECC and Block Management, which enable the system to flexibly address diversified needs, Like the T5781, the T5782 also offers flash memory and DRAM test capabilities, enabling MCP (Multi Chip Package) test in addition to flash memory wafer and package test.

Compatible with Previous Models
The T5782 is compatible with the T5781 and the T5781ES (Engineering Station), a tester designed for lab use.
Test programs developed on the T5781ES can be used for wafer test on the T5782, and for volume production on the T5781, making this trio of products a highly cost-effective test solution.

FutureSuite® supporting multi-language is adopted
FutureSuite OS adds flexibility across the series of testers.
FutureSuite supports both MCI and ATL languages.